Sponsored Content: JEOL's New Cryo-EM and Atomic Imaging Platforms
JEOL has announced three next-generation microscopy platforms, addressing key challenges in structural biology and materials research, including throughput, automation, reproducibility and ultra-high-resolution analysis.
CRYO ARM™ 200S and CRYO ARM™ 300S: Smarter Cryo-EM for Every Laboratory
The new CRYO ARM™ 200S (200 kV) and CRYO ARM™ 300S (300 kV) are highly automated cryo-electron microscopes supporting SPA, cryo-ET, 3DED and MicroED within a single platform.
A key advance is integration with SmartScope, an AI-driven, open-source data acquisition package that automatically identifies imaging targets and automates collection workflows. By simplifying operation and reducing manual intervention, SmartScope enables users of all experience levels to achieve consistent, high-quality results.
Both systems introduce CRYO SPECPORTER™-S, which separates long-term specimen storage from transfer magazines, allowing selective sample exchange. Cartridge capacity has increased from four to six specimens per magazine, supporting higher throughput and overnight acquisition. Samples are maintained under vacuum at liquid nitrogen temperatures, ensuring up to one month of clean, ice contamination-free storage and greater scheduling flexibility.
The microscopes also feature fringe-free illumination, maximising information capture while minimising beam-induced damage. The CRYO ARM™ 300S further enhances beam stability and flexibility through improvements to the condenser lens and aperture system.
Integration with JEOL's CryoLameller (CRYO-FIB-SEM) platform enables seamless cryo-CLEM workflows from preparation through analysis while preserving positional information and improving reproducibility.
GRAND ARM™ 3: Pushing the Limits of Atomic Resolution
For materials scientists, JEOL's new GRAND ARM™ 3 represents a major advance in atomic-scale analysis.
Developed in collaboration with CEOS GmbH, this 300 kV platform introduces two next-generation aberration correctors: LASCOR (Large Aperture STEM Corrector) and ATCOR (Advanced TEM Corrector).
LASCOR achieves HAADF-STEM resolutions better than 49 pm at 300 kV and 76 pm at 80 kV, while extending the aberration-corrected angular field beyond 85 mrad at 300kV. ATCOR delivers TEM lattice resolution below 50 pm and an information limit below 60 pm.
Combining advanced aberration correction with 158 mm² dual SDD EDS detectors, GRAND ARM™ 3 enables high-sensitivity elemental mapping while maintaining atomic-resolution probe sizes. A high-speed STEM scanning system capable of 30 frames per second or more enables real-time observation of atomic migration, phase transformations and chemical reactions at the atomic scale.
Together, the new CRYO ARM™ and GRAND ARM™ platforms demonstrate JEOL's commitment to accelerating discovery through automation, throughput and exceptional analytical performance across the life and materials sciences.